Composition of metal layers in CMOS-MEMS micromachining process

Benito Granados-Rojas, Mario Alfredo Reyes-Barranca, Luis Martin Flores-Nava, Griselda Stephany Abarca-Jimenez, Miguel Angel Aleman-Arce, Yesenia Eleonor Gonzalez-Navarro

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

1 Cita (Scopus)

Resumen

In this work some representative mechanical and materials-related issues in the design and fabrication of CMOS-MEMS devices are reviewed, especially those appearing in the further on-chip micromachining process needed to release MEMS structures within conventional CMOS integrated circuits. CMOS-MEMS is a micro-sensor and micro-actuator development technique consisting in applying either an etching or deposition process to previously designed and fabricated CMOS circuitry, in order to enhance its mechanical, optical, chemical or so properties achieving a micro-electromechanical behavior. In the case of material removal, also known as micromachining, a surface or bulk process, usually a wet chemical etching, is used to release metallic structures embedded in insulating glass layers. Nevertheless, the composition of those metallic structures may vary from a CMOS fabrication technology to another and should not be neglected during the etching process.

Idioma originalInglés
Título de la publicación alojada2019 16th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2019
EditorialInstitute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)9781728148403
DOI
EstadoPublicada - sep. 2019
Evento16th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2019 - Mexico City, México
Duración: 11 sep. 201913 sep. 2019

Serie de la publicación

Nombre2019 16th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2019

Conferencia

Conferencia16th International Conference on Electrical Engineering, Computing Science and Automatic Control, CCE 2019
País/TerritorioMéxico
CiudadMexico City
Período11/09/1913/09/19

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