Raman study of luminescent spark processed porous GaAs

M. Rojas-López; J. M. Gracia-Jiménez; M. A. Vidal; H. Navarro-Contreras; R. Silva-González; E. Gómez

doi:10.1116/1.1366709

Raman study of luminescent spark processed porous GaAs

M. Rojas-López, J. M. Gracia-Jiménez, M. A. Vidal, H. Navarro-Contreras, R. Silva-González, E. Gómez

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9 Scopus citations

Abstract

A microRaman probe and a scanning electron microscope with energy dispersive spectroscopy system were used to analyze spark-processed porous GaAs samples prepared by high voltage discharges at low repetition rates in different ambients. The resulting material was found to be amorphous material, with amorphous-GaAs, for samples prepared in pure nitrogen. The cubic phases of As2O3 were substituted by the monoclinic phase of As2O3 'claudetite' for samples prepared under a low concentration of oxygen.

Original language	American English
Pages	622-627
Number of pages	6
DOIs	https://doi.org/10.1116/1.1366709
State	Published - 1 May 2001
Externally published	Yes
Event	Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures - Duration: 1 May 2001 → …

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Conference	Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Period	1/05/01 → …

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10.1116/1.1366709

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abstract = "A microRaman probe and a scanning electron microscope with energy dispersive spectroscopy system were used to analyze spark-processed porous GaAs samples prepared by high voltage discharges at low repetition rates in different ambients. The resulting material was found to be amorphous material, with amorphous-GaAs, for samples prepared in pure nitrogen. The cubic phases of As2O3 were substituted by the monoclinic phase of As2O3 'claudetite' for samples prepared under a low concentration of oxygen.",

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doi = "10.1116/1.1366709",

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AU - Rojas-López, M.

AU - Gracia-Jiménez, J. M.

AU - Vidal, M. A.

AU - Navarro-Contreras, H.

AU - Silva-González, R.

AU - Gómez, E.

PY - 2001/5/1

Y1 - 2001/5/1

N2 - A microRaman probe and a scanning electron microscope with energy dispersive spectroscopy system were used to analyze spark-processed porous GaAs samples prepared by high voltage discharges at low repetition rates in different ambients. The resulting material was found to be amorphous material, with amorphous-GaAs, for samples prepared in pure nitrogen. The cubic phases of As2O3 were substituted by the monoclinic phase of As2O3 'claudetite' for samples prepared under a low concentration of oxygen.

AB - A microRaman probe and a scanning electron microscope with energy dispersive spectroscopy system were used to analyze spark-processed porous GaAs samples prepared by high voltage discharges at low repetition rates in different ambients. The resulting material was found to be amorphous material, with amorphous-GaAs, for samples prepared in pure nitrogen. The cubic phases of As2O3 were substituted by the monoclinic phase of As2O3 'claudetite' for samples prepared under a low concentration of oxygen.

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T2 - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Y2 - 1 May 2001

ER -

Raman study of luminescent spark processed porous GaAs

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