Roughness effects on laser scattering patterns

Blanca Arlette Serrato Espino; Ivan Dominguez Lopez; Julio Cesar Sosa Savedra; Adrian Luis Garcia Garcia

doi:10.1109/iCASAT48251.2019.9069518

Roughness effects on laser scattering patterns

Blanca Arlette Serrato Espino, Ivan Dominguez Lopez, Julio Cesar Sosa Savedra, Adrian Luis Garcia Garcia

Producción científica: Capítulo del libro/informe/acta de congreso › Contribución a la conferencia › revisión exhaustiva

Resumen

This work reports on the use of a CMOS sensor with 1440×1080 pixel resolution, to measure changes on the scattering laser light patterns on aluminum surfaces due to different average roughness. The laser beam strikes perpendicularly to the grinding direction. As expected, the higher the roughness, the larger the area of scattered light on the detector. The detector has three channels: red, green and blue (RGB space). A statistical analysis of the intensity per pixel in each channel was measured, the red channel was chosen because it provided more information. Finally, a transversal cut along the scattering patterns show a relation between surface roughness and the width of the scattering distribution.

Idioma original	Inglés
Título de la publicación alojada	2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019
Editorial	Institute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)	9781728131108
DOI	https://doi.org/10.1109/iCASAT48251.2019.9069518
Estado	Publicada - nov. 2019
Publicado de forma externa	Sí
Evento	2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019 - Queretaro, México Duración: 27 nov. 2019 → 28 nov. 2019

Serie de la publicación

Nombre	2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019

Conferencia

Conferencia	2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019
País/Territorio	México
Ciudad	Queretaro
Período	27/11/19 → 28/11/19

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Este resultado contribuye a los siguientes Objetivos de Desarrollo Sostenible

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10.1109/iCASAT48251.2019.9069518

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Serrato Espino, B. A., Dominguez Lopez, I., Sosa Savedra, J. C., & Luis Garcia Garcia, A. (2019). Roughness effects on laser scattering patterns. En 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019 Artículo 9069518 (2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/iCASAT48251.2019.9069518

Serrato Espino, Blanca Arlette ; Dominguez Lopez, Ivan ; Sosa Savedra, Julio Cesar et al. / Roughness effects on laser scattering patterns. 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019. Institute of Electrical and Electronics Engineers Inc., 2019. (2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019).

@inproceedings{2830c107860340f5850d12333db74e50,

title = "Roughness effects on laser scattering patterns",

abstract = "This work reports on the use of a CMOS sensor with 1440×1080 pixel resolution, to measure changes on the scattering laser light patterns on aluminum surfaces due to different average roughness. The laser beam strikes perpendicularly to the grinding direction. As expected, the higher the roughness, the larger the area of scattered light on the detector. The detector has three channels: red, green and blue (RGB space). A statistical analysis of the intensity per pixel in each channel was measured, the red channel was chosen because it provided more information. Finally, a transversal cut along the scattering patterns show a relation between surface roughness and the width of the scattering distribution.",

keywords = "CMOS sensor, histogram, pattern, roughness, scattered light",

author = "{Serrato Espino}, {Blanca Arlette} and {Dominguez Lopez}, Ivan and {Sosa Savedra}, {Julio Cesar} and {Luis Garcia Garcia}, Adrian",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019 ; Conference date: 27-11-2019 Through 28-11-2019",

year = "2019",

month = nov,

doi = "10.1109/iCASAT48251.2019.9069518",

language = "Ingl{\'e}s",

series = "2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019",

address = "Estados Unidos",

}

Serrato Espino, BA, Dominguez Lopez, I , Sosa Savedra, JC & Luis Garcia Garcia, A 2019, Roughness effects on laser scattering patterns. En 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019., 9069518, 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019, Institute of Electrical and Electronics Engineers Inc., 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019, Queretaro, México, 27/11/19. https://doi.org/10.1109/iCASAT48251.2019.9069518

Roughness effects on laser scattering patterns. / Serrato Espino, Blanca Arlette; Dominguez Lopez, Ivan ; Sosa Savedra, Julio Cesar et al.
2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019. Institute of Electrical and Electronics Engineers Inc., 2019. 9069518 (2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019).

Producción científica: Capítulo del libro/informe/acta de congreso › Contribución a la conferencia › revisión exhaustiva

TY - GEN

T1 - Roughness effects on laser scattering patterns

AU - Serrato Espino, Blanca Arlette

AU - Dominguez Lopez, Ivan

AU - Sosa Savedra, Julio Cesar

AU - Luis Garcia Garcia, Adrian

PY - 2019/11

Y1 - 2019/11

N2 - This work reports on the use of a CMOS sensor with 1440×1080 pixel resolution, to measure changes on the scattering laser light patterns on aluminum surfaces due to different average roughness. The laser beam strikes perpendicularly to the grinding direction. As expected, the higher the roughness, the larger the area of scattered light on the detector. The detector has three channels: red, green and blue (RGB space). A statistical analysis of the intensity per pixel in each channel was measured, the red channel was chosen because it provided more information. Finally, a transversal cut along the scattering patterns show a relation between surface roughness and the width of the scattering distribution.

AB - This work reports on the use of a CMOS sensor with 1440×1080 pixel resolution, to measure changes on the scattering laser light patterns on aluminum surfaces due to different average roughness. The laser beam strikes perpendicularly to the grinding direction. As expected, the higher the roughness, the larger the area of scattered light on the detector. The detector has three channels: red, green and blue (RGB space). A statistical analysis of the intensity per pixel in each channel was measured, the red channel was chosen because it provided more information. Finally, a transversal cut along the scattering patterns show a relation between surface roughness and the width of the scattering distribution.

KW - CMOS sensor

KW - histogram

KW - pattern

KW - roughness

KW - scattered light

UR - http://www.scopus.com/inward/record.url?scp=85084654625&partnerID=8YFLogxK

U2 - 10.1109/iCASAT48251.2019.9069518

DO - 10.1109/iCASAT48251.2019.9069518

M3 - Contribución a la conferencia

AN - SCOPUS:85084654625

T3 - 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019

BT - 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019

Y2 - 27 November 2019 through 28 November 2019

ER -

Serrato Espino BA, Dominguez Lopez I , Sosa Savedra JC , Luis Garcia Garcia A. Roughness effects on laser scattering patterns. En 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019. Institute of Electrical and Electronics Engineers Inc. 2019. 9069518. (2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019). doi: 10.1109/iCASAT48251.2019.9069518

Roughness effects on laser scattering patterns

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