TY - GEN
T1 - Roughness effects on laser scattering patterns
AU - Serrato Espino, Blanca Arlette
AU - Dominguez Lopez, Ivan
AU - Sosa Savedra, Julio Cesar
AU - Luis Garcia Garcia, Adrian
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/11
Y1 - 2019/11
N2 - This work reports on the use of a CMOS sensor with 1440×1080 pixel resolution, to measure changes on the scattering laser light patterns on aluminum surfaces due to different average roughness. The laser beam strikes perpendicularly to the grinding direction. As expected, the higher the roughness, the larger the area of scattered light on the detector. The detector has three channels: red, green and blue (RGB space). A statistical analysis of the intensity per pixel in each channel was measured, the red channel was chosen because it provided more information. Finally, a transversal cut along the scattering patterns show a relation between surface roughness and the width of the scattering distribution.
AB - This work reports on the use of a CMOS sensor with 1440×1080 pixel resolution, to measure changes on the scattering laser light patterns on aluminum surfaces due to different average roughness. The laser beam strikes perpendicularly to the grinding direction. As expected, the higher the roughness, the larger the area of scattered light on the detector. The detector has three channels: red, green and blue (RGB space). A statistical analysis of the intensity per pixel in each channel was measured, the red channel was chosen because it provided more information. Finally, a transversal cut along the scattering patterns show a relation between surface roughness and the width of the scattering distribution.
KW - CMOS sensor
KW - histogram
KW - pattern
KW - roughness
KW - scattered light
UR - http://www.scopus.com/inward/record.url?scp=85084654625&partnerID=8YFLogxK
U2 - 10.1109/iCASAT48251.2019.9069518
DO - 10.1109/iCASAT48251.2019.9069518
M3 - Contribución a la conferencia
AN - SCOPUS:85084654625
T3 - 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019
BT - 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2019 IEEE International Conference on Applied Science and Advanced Technology, iCASAT 2019
Y2 - 27 November 2019 through 28 November 2019
ER -
