Physical properties of In2S3 thin films grown by chemical bath deposition at different temperatures

P. E. Rodríguez-Hernández, F. De Moure-Flores, A. Guilléncervantes, E. Campos-González, J. Santos-Cruz, S. A. Mayénhernández, J. S. Arias-Cerón, M. L. de la Olvera, O. Zelayaángel, G. Contreras-Puente

Producción científica: Contribución a una revistaArtículorevisión exhaustiva

8 Citas (Scopus)

Resumen

Indium sulphide thin films were deposited on SnO2:F/soda-lime glass substrates at different temperatures by chemical bath deposition. InCl3 and C2H5NS were employed as indium and sulfur sources, respectively. The In2S3 films were deposited at temperatures of: 60 °C, 70 °C and 80 °C. The as-grown films were annealed at 300 °C in nitrogen atmosphere. The physical properties were analyzed as a function of the bath temperature, before and after the thermal treatment. The X-ray diffraction and Raman characterizations indicate that In2S3 films with tetragonal phase were obtained. Atomic force microscopy showed that after the annealing features of grain coalescence on surface are present. The UV-Vis analysis indicated that after thermal treatment In2S3 films have high transmission in the visible range and a bandgap above 2.50 eV.

Idioma originalInglés
Páginas (desde-hasta)389-396
Número de páginas8
PublicaciónChalcogenide Letters
Volumen13
N.º8
EstadoPublicada - 1 ago. 2016

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