Photoluminescence spectra and carrier mobilities in polycrystalline films of CdTe

J. M. Figueroa, F. Sánchez-Sinencio, J. G. Mendoza-Alvarez, O. Zelaya, G. Contreras-Puente, A. Díaz-Góngora

Producción científica: Contribución a una revistaArtículorevisión exhaustiva

14 Citas (Scopus)

Resumen

The radiative defect density, as determined by low temperature photoluminescence, measured in CdTe polycrystalline films, is compared with electron and hole lateral mobilities measured on the same films. This comparison shows that intracrystalline and/or intercrystalline density of defects is more important in large grain films than in small grain films. In any case charge carrier transport in the films is a trap-charge-controlled process.

Idioma originalInglés
Páginas (desde-hasta)651-656
Número de páginas6
PublicaciónJournal of Crystal Growth
Volumen106
N.º4
DOI
EstadoPublicada - dic. 1990

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