Photoluminescence spectra and carrier mobilities in polycrystalline films of CdTe

J. M. Figueroa, F. Sánchez-Sinencio, J. G. Mendoza-Alvarez, O. Zelaya, G. Contreras-Puente, A. Díaz-Góngora

Research output: Contribution to journalArticlepeer-review

14 Scopus citations

Abstract

The radiative defect density, as determined by low temperature photoluminescence, measured in CdTe polycrystalline films, is compared with electron and hole lateral mobilities measured on the same films. This comparison shows that intracrystalline and/or intercrystalline density of defects is more important in large grain films than in small grain films. In any case charge carrier transport in the films is a trap-charge-controlled process.

Original languageEnglish
Pages (from-to)651-656
Number of pages6
JournalJournal of Crystal Growth
Volume106
Issue number4
DOIs
StatePublished - Dec 1990

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