Photoluminescence and Raman spectroscopy in porous SiC

T. V. Torchynska; A. Díaz Cano; S. Jiménez Sandoval; M. Dybic; S. Ostapenko; M. Mynbaeva

doi:10.1016/j.mejo.2005.02.116

Photoluminescence and Raman spectroscopy in porous SiC

Título traducido de la contribución: Fotoluminiscencia y espectroscopia Raman en SiC poroso

T. V. Torchynska, A. Díaz Cano, S. Jiménez Sandoval, M. Dybic, S. Ostapenko, M. Mynbaeva

Producción científica: Contribución a una revista › Artículo de la conferencia › revisión exhaustiva

26 Citas (Scopus)

Resumen

This paper presents results of porous SiC characterization using photoluminescence, Raman scattering and Atomic Force Microscopy. A comparative optical spectroscopy study on bulk SiC and porous SiC layers has shown a number of new features specific to nano-crystallite materials. The role of these effects on optical spectroscopy data in porous SiC accessed by photoluminescence and Raman scattering is discussed.

Título traducido de la contribución	Fotoluminiscencia y espectroscopia Raman en SiC poroso
Idioma original	Inglés
Páginas (desde-hasta)	536-538
Número de páginas	3
Publicación	Microelectronics Journal
Volumen	36
N.º	3-6
DOI	https://doi.org/10.1016/j.mejo.2005.02.116
Estado	Publicada - mar. 2005

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@article{cbfe1fef5c984d76940497ac69328686,

title = "Photoluminescence and Raman spectroscopy in porous SiC",

abstract = "This paper presents results of porous SiC characterization using photoluminescence, Raman scattering and Atomic Force Microscopy. A comparative optical spectroscopy study on bulk SiC and porous SiC layers has shown a number of new features specific to nano-crystallite materials. The role of these effects on optical spectroscopy data in porous SiC accessed by photoluminescence and Raman scattering is discussed.",

keywords = "Exciton, Phonon modes, Photoluminescence, Porous SiC, Raman scattering",

author = "Torchynska, {T. V.} and Cano, {A. D{\'i}az} and Sandoval, {S. Jim{\'e}nez} and M. Dybic and S. Ostapenko and M. Mynbaeva",

note = "Funding Information: The work was supported by CONACYT Mexico (Project U42436-Y) and National Science Foundation award DMI-0218967, as well as by CGPI-IPN. The work at Ioffe Institute was supported by an International Cooperative Program (NICOP) administered by the Office of Naval Research under Grant N00014-01-1-0828 (program monitor C. Wood).",

year = "2005",

month = mar,

doi = "10.1016/j.mejo.2005.02.116",

language = "Ingl{\'e}s",

volume = "36",

pages = "536--538",

journal = "Microelectronics Journal",

issn = "0026-2692",

publisher = "Elsevier BV",

number = "3-6",

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TY - JOUR

T1 - Photoluminescence and Raman spectroscopy in porous SiC

AU - Torchynska, T. V.

AU - Cano, A. Díaz

AU - Sandoval, S. Jiménez

AU - Dybic, M.

AU - Ostapenko, S.

AU - Mynbaeva, M.

N1 - Funding Information: The work was supported by CONACYT Mexico (Project U42436-Y) and National Science Foundation award DMI-0218967, as well as by CGPI-IPN. The work at Ioffe Institute was supported by an International Cooperative Program (NICOP) administered by the Office of Naval Research under Grant N00014-01-1-0828 (program monitor C. Wood).

PY - 2005/3

Y1 - 2005/3

N2 - This paper presents results of porous SiC characterization using photoluminescence, Raman scattering and Atomic Force Microscopy. A comparative optical spectroscopy study on bulk SiC and porous SiC layers has shown a number of new features specific to nano-crystallite materials. The role of these effects on optical spectroscopy data in porous SiC accessed by photoluminescence and Raman scattering is discussed.

AB - This paper presents results of porous SiC characterization using photoluminescence, Raman scattering and Atomic Force Microscopy. A comparative optical spectroscopy study on bulk SiC and porous SiC layers has shown a number of new features specific to nano-crystallite materials. The role of these effects on optical spectroscopy data in porous SiC accessed by photoluminescence and Raman scattering is discussed.

KW - Exciton

KW - Phonon modes

KW - Photoluminescence

KW - Porous SiC

KW - Raman scattering

UR - http://www.scopus.com/inward/record.url?scp=33644529424&partnerID=8YFLogxK

U2 - 10.1016/j.mejo.2005.02.116

DO - 10.1016/j.mejo.2005.02.116

M3 - Artículo de la conferencia

AN - SCOPUS:33644529424

SN - 0026-2692

VL - 36

SP - 536

EP - 538

JO - Microelectronics Journal

JF - Microelectronics Journal

IS - 3-6

ER -

Photoluminescence and Raman spectroscopy in porous SiC

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