Photoacoustic thermal characterization of spark-processed porous silicon

A. Cruz-Orea; I. Delgadilllo; H. Vargas; A. Gudiño-Martínez; E. Marín; C. Vázquez-López; A. Calderón; J. J. Alvarado-Gil

doi:10.1063/1.362626

Photoacoustic thermal characterization of spark-processed porous silicon

A. Cruz-Orea, I. Delgadilllo, H. Vargas, A. Gudiño-Martínez, E. Marín, C. Vázquez-López, A. Calderón, J. J. Alvarado-Gil

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

26 Citas (Scopus)

Resumen

A non-separation approach to determine the spark-processed porous silicon thermal parameters is presented. This thermal characterization was performed through application of the photoacoustic technique, in combination with compositional models for spark-processed porous silicon samples. The thermal parameters obtained are in agreement with existing studies about the composition of this material. This approach opens the possibility of performing the thermal characterization of other porous semiconductors and analogous materials.

Idioma original	Inglés
Páginas (desde-hasta)	8951-8954
Número de páginas	4
Publicación	Journal of Applied Physics
Volumen	79
N.º	12
DOI	https://doi.org/10.1063/1.362626
Estado	Publicada - 15 jun. 1996
Publicado de forma externa	Sí

Acceder al documento

10.1063/1.362626

Otros archivos y enlaces

Enlace a la publicación en Scopus

Citar esto

@article{f8d4e77461f34b1a8422617158b819dd,

title = "Photoacoustic thermal characterization of spark-processed porous silicon",

abstract = "A non-separation approach to determine the spark-processed porous silicon thermal parameters is presented. This thermal characterization was performed through application of the photoacoustic technique, in combination with compositional models for spark-processed porous silicon samples. The thermal parameters obtained are in agreement with existing studies about the composition of this material. This approach opens the possibility of performing the thermal characterization of other porous semiconductors and analogous materials.",

author = "A. Cruz-Orea and I. Delgadilllo and H. Vargas and A. Gudi{\~n}o-Mart{\'i}nez and E. Mar{\'i}n and C. V{\'a}zquez-L{\'o}pez and A. Calder{\'o}n and Alvarado-Gil, {J. J.}",

year = "1996",

month = jun,

day = "15",

doi = "10.1063/1.362626",

language = "Ingl{\'e}s",

volume = "79",

pages = "8951--8954",

journal = "Journal of Applied Physics",

issn = "0021-8979",

number = "12",

}

TY - JOUR

T1 - Photoacoustic thermal characterization of spark-processed porous silicon

AU - Cruz-Orea, A.

AU - Delgadilllo, I.

AU - Vargas, H.

AU - Gudiño-Martínez, A.

AU - Marín, E.

AU - Vázquez-López, C.

AU - Calderón, A.

AU - Alvarado-Gil, J. J.

PY - 1996/6/15

Y1 - 1996/6/15

N2 - A non-separation approach to determine the spark-processed porous silicon thermal parameters is presented. This thermal characterization was performed through application of the photoacoustic technique, in combination with compositional models for spark-processed porous silicon samples. The thermal parameters obtained are in agreement with existing studies about the composition of this material. This approach opens the possibility of performing the thermal characterization of other porous semiconductors and analogous materials.

AB - A non-separation approach to determine the spark-processed porous silicon thermal parameters is presented. This thermal characterization was performed through application of the photoacoustic technique, in combination with compositional models for spark-processed porous silicon samples. The thermal parameters obtained are in agreement with existing studies about the composition of this material. This approach opens the possibility of performing the thermal characterization of other porous semiconductors and analogous materials.

UR - http://www.scopus.com/inward/record.url?scp=0001536822&partnerID=8YFLogxK

U2 - 10.1063/1.362626

DO - 10.1063/1.362626

M3 - Artículo

SN - 0021-8979

VL - 79

SP - 8951

EP - 8954

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 12

ER -

Photoacoustic thermal characterization of spark-processed porous silicon

Resumen

Acceder al documento

Otros archivos y enlaces

Huella

Citar esto