Photoacoustic thermal characterization of spark-processed porous silicon

A. Cruz-Orea; I. Delgadilllo; H. Vargas; A. Gudiño-Martínez; E. Marín; C. Vázquez-López; A. Calderón; J. J. Alvarado-Gil

doi:10.1063/1.362626

Photoacoustic thermal characterization of spark-processed porous silicon

A. Cruz-Orea, I. Delgadilllo, H. Vargas, A. Gudiño-Martínez, E. Marín, C. Vázquez-López, A. Calderón, J. J. Alvarado-Gil

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

A non-separation approach to determine the spark-processed porous silicon thermal parameters is presented. This thermal characterization was performed through application of the photoacoustic technique, in combination with compositional models for spark-processed porous silicon samples. The thermal parameters obtained are in agreement with existing studies about the composition of this material. This approach opens the possibility of performing the thermal characterization of other porous semiconductors and analogous materials.

Original language	English
Pages (from-to)	8951-8954
Number of pages	4
Journal	Journal of Applied Physics
Volume	79
Issue number	12
DOIs	https://doi.org/10.1063/1.362626
State	Published - 15 Jun 1996
Externally published	Yes

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@article{f8d4e77461f34b1a8422617158b819dd,

title = "Photoacoustic thermal characterization of spark-processed porous silicon",

abstract = "A non-separation approach to determine the spark-processed porous silicon thermal parameters is presented. This thermal characterization was performed through application of the photoacoustic technique, in combination with compositional models for spark-processed porous silicon samples. The thermal parameters obtained are in agreement with existing studies about the composition of this material. This approach opens the possibility of performing the thermal characterization of other porous semiconductors and analogous materials.",

author = "A. Cruz-Orea and I. Delgadilllo and H. Vargas and A. Gudi{\~n}o-Mart{\'i}nez and E. Mar{\'i}n and C. V{\'a}zquez-L{\'o}pez and A. Calder{\'o}n and Alvarado-Gil, {J. J.}",

year = "1996",

month = jun,

day = "15",

doi = "10.1063/1.362626",

language = "Ingl{\'e}s",

volume = "79",

pages = "8951--8954",

journal = "Journal of Applied Physics",

issn = "0021-8979",

number = "12",

}

TY - JOUR

T1 - Photoacoustic thermal characterization of spark-processed porous silicon

AU - Cruz-Orea, A.

AU - Delgadilllo, I.

AU - Vargas, H.

AU - Gudiño-Martínez, A.

AU - Marín, E.

AU - Vázquez-López, C.

AU - Calderón, A.

AU - Alvarado-Gil, J. J.

PY - 1996/6/15

Y1 - 1996/6/15

N2 - A non-separation approach to determine the spark-processed porous silicon thermal parameters is presented. This thermal characterization was performed through application of the photoacoustic technique, in combination with compositional models for spark-processed porous silicon samples. The thermal parameters obtained are in agreement with existing studies about the composition of this material. This approach opens the possibility of performing the thermal characterization of other porous semiconductors and analogous materials.

AB - A non-separation approach to determine the spark-processed porous silicon thermal parameters is presented. This thermal characterization was performed through application of the photoacoustic technique, in combination with compositional models for spark-processed porous silicon samples. The thermal parameters obtained are in agreement with existing studies about the composition of this material. This approach opens the possibility of performing the thermal characterization of other porous semiconductors and analogous materials.

UR - http://www.scopus.com/inward/record.url?scp=0001536822&partnerID=8YFLogxK

U2 - 10.1063/1.362626

DO - 10.1063/1.362626

M3 - Artículo

SN - 0021-8979

VL - 79

SP - 8951

EP - 8954

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 12

ER -

Photoacoustic thermal characterization of spark-processed porous silicon

Abstract

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