Resumen
CdS films were grown on glass substrates by the close spaced vapor transport technique (CSVT). We deposited two series of samples: a) with a substrate temperature of 150°C (group A) and b) with a variation of substrate temperature between 200°C and 550°C, at intervals of 50°C (group B). The samples of group A were annealed in N2 atmosphere, from 200°C to 400°C, at intervals of 50°C. All samples were measured by X-ray diffraction and optical transmission. X-ray diffraction patterns show that the films had a mixture of cubic and hexagonal structure remained unchanged after the thermal annealing, the main phase present was cubic. The energy band gap shows a thermal stability. The substrate temperature has no effect over the crystal structure and band gap energy. Transmittance and X-ray measurements show a thermal stability of the crystal structure and band gap energy.
Idioma original | Inglés |
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Páginas (desde-hasta) | 3694-3697 |
Número de páginas | 4 |
Publicación | Physica Status Solidi C: Conferences |
Volumen | 2 |
N.º | 10 |
DOI | |
Estado | Publicada - 2005 |