CdS films were grown on glass substrates by the close spaced vapor transport technique (CSVT). We deposited two series of samples: a) with a substrate temperature of 150°C (group A) and b) with a variation of substrate temperature between 200°C and 550°C, at intervals of 50°C (group B). The samples of group A were annealed in N2 atmosphere, from 200°C to 400°C, at intervals of 50°C. All samples were measured by X-ray diffraction and optical transmission. X-ray diffraction patterns show that the films had a mixture of cubic and hexagonal structure remained unchanged after the thermal annealing, the main phase present was cubic. The energy band gap shows a thermal stability. The substrate temperature has no effect over the crystal structure and band gap energy. Transmittance and X-ray measurements show a thermal stability of the crystal structure and band gap energy. © 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
|Original language||American English|
|Number of pages||3324|
|State||Published - 7 Nov 2005|
|Event||Physica Status Solidi C: Conferences - |
Duration: 7 Nov 2005 → …
|Conference||Physica Status Solidi C: Conferences|
|Period||7/11/05 → …|