Resumen
Complex kinetics of the injection-enhanced change of the GaP:N LED emitting power and transformation of luminescence and DLTS spectra were investigated. It is shown that injection-enhanced processes in GaP:N LED's includes: a) the interstitial defects (Zni) diffusion from the highly doped layer near the contact into the active layer; b) the relief of stresses due to the arising of a dislocation network and the generation of point defects (vacancies antisites); c) diffusion of the impurity atoms via the vacancies which leads to dissociation of the nitrogen atom complexes (NN i ).
Idioma original | Inglés |
---|---|
Páginas (desde-hasta) | 423-429 |
Número de páginas | 7 |
Publicación | Journal of Electronic Materials |
Volumen | 21 |
N.º | 4 |
DOI | |
Estado | Publicada - abr. 1992 |
Publicado de forma externa | Sí |