Abstract
Complex kinetics of the injection-enhanced change of the GaP:N LED emitting power and transformation of luminescence and DLTS spectra were investigated. It is shown that injection-enhanced processes in GaP:N LED's includes: a) the interstitial defects (Zni) diffusion from the highly doped layer near the contact into the active layer; b) the relief of stresses due to the arising of a dislocation network and the generation of point defects (vacancies antisites); c) diffusion of the impurity atoms via the vacancies which leads to dissociation of the nitrogen atom complexes (NN i ).
Original language | English |
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Pages (from-to) | 423-429 |
Number of pages | 7 |
Journal | Journal of Electronic Materials |
Volume | 21 |
Issue number | 4 |
DOIs | |
State | Published - Apr 1992 |
Externally published | Yes |
Keywords
- DLTS spectra
- Diffusion
- GaP:N
- Interstitial defects