Exciton thermal escape in symmetric InAs quantum dots in InGaAsZGaAs well structures

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Resumen

The photo luminescence and its temperature dependence have been investigated for the ensembles of InAs quantum dots embedded in symmetric In0.15Ga0.85AsZGaAs quantum wells with different PL intensities. The solution of the set of rate equations for exciton dynamics was used to analyze the nature of thermal activation energies of the QD photoluminescence quenching. It is revealed two different stages of thermally activated quenching of the QD PL intensity caused by thermal escape of excitons from the In0.15Ga0.85As/GaAs QW into the GaAs barrier and from the QDs into the QWs with their subsequent nonradiative recombination. The variety of activation energies of PL thermal quenching is discussed as well.

Idioma originalInglés
Páginas (desde-hasta)379-381
Número de páginas3
PublicaciónPhysica Status Solidi (C) Current Topics in Solid State Physics
Volumen4
N.º2
DOI
EstadoPublicada - 2007
EventoInternational Conference on Superlattices, Nano-structures and Nano-devices, ICSNN-2006 - Istanbul, Turquía
Duración: 30 jul. 20064 ago. 2006

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