Exciton thermal escape in symmetric InAs quantum dots in InGaAsZGaAs well structures

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Abstract

The photo luminescence and its temperature dependence have been investigated for the ensembles of InAs quantum dots embedded in symmetric In0.15Ga0.85AsZGaAs quantum wells with different PL intensities. The solution of the set of rate equations for exciton dynamics was used to analyze the nature of thermal activation energies of the QD photoluminescence quenching. It is revealed two different stages of thermally activated quenching of the QD PL intensity caused by thermal escape of excitons from the In0.15Ga0.85As/GaAs QW into the GaAs barrier and from the QDs into the QWs with their subsequent nonradiative recombination. The variety of activation energies of PL thermal quenching is discussed as well.

Original languageEnglish
Pages (from-to)379-381
Number of pages3
JournalPhysica Status Solidi (C) Current Topics in Solid State Physics
Volume4
Issue number2
DOIs
StatePublished - 2007
EventInternational Conference on Superlattices, Nano-structures and Nano-devices, ICSNN-2006 - Istanbul, Turkey
Duration: 30 Jul 20064 Aug 2006

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