TY - JOUR
T1 - Determination of the barrier height of Pt - Ir Schottky nano-contacts on Al-doped ZnO thin films by conductive Atomic Force Microscopy
AU - Eduardo-River, L. J.
AU - Muñoz-Aguirre, Narcizo
AU - Gutiérrez-Paredes, G. Juliana
AU - Tamayo-Meza, P. A.
AU - Zapata, Alejandro A.
AU - Martínez-Pérez, L.
N1 - Publisher Copyright:
© 2018 Sociedad Mexicana de Fisica.
PY - 2018/1/1
Y1 - 2018/1/1
N2 - By means of the I-V characteristics measured at room temperature, the height of the Schottky barrier established by the conductive Pt - Ir tip of an Atomic Force Microscope on the aluminum doped ZnO thin films were estimated in the range of 0:58 - 0:64 eV. The ideality factors were in the range of 2:11-1:39, respectively. These values are in accordance with those reported by other authors that measured the height of the Pt Schottky barrier on ZnO by means of several methods. The procedure detailed in this work suggests that the scanning time for obtaining I-V Schottky characteristics is of the order of 2 ms.
AB - By means of the I-V characteristics measured at room temperature, the height of the Schottky barrier established by the conductive Pt - Ir tip of an Atomic Force Microscope on the aluminum doped ZnO thin films were estimated in the range of 0:58 - 0:64 eV. The ideality factors were in the range of 2:11-1:39, respectively. These values are in accordance with those reported by other authors that measured the height of the Pt Schottky barrier on ZnO by means of several methods. The procedure detailed in this work suggests that the scanning time for obtaining I-V Schottky characteristics is of the order of 2 ms.
KW - Conductive AFM
KW - Electrical properties at nanoscale level
KW - I-V Schottky characteristics
KW - Pt Schottky nano-contact on ZnO thin films
KW - Schottky barrier height
UR - http://www.scopus.com/inward/record.url?scp=85057533848&partnerID=8YFLogxK
U2 - 10.31349/revmexfis.64.655
DO - 10.31349/revmexfis.64.655
M3 - Artículo
AN - SCOPUS:85057533848
SN - 0035-001X
VL - 64
SP - 655
EP - 661
JO - Revista Mexicana de Fisica
JF - Revista Mexicana de Fisica
IS - 6
ER -