Design of a test bed for teaching/research purposes in PHEVs

Irwin A. Diaz-Diaz, Yuz A. Zuñiga-Ventura, Ilse Cervantes, Noé Villa-Villaseñor

Resultado de la investigación: Capítulo del libro/informe/acta de congresoContribución a la conferencia

Resumen

In this paper, the design of a measurement system for teaching and research purposes in plug-in hybrid electric vehicles is presented. The implemented measurement system monitors the interest variables such as current, voltage, power consumption, battery temperature and state of charge, among many others. The test bed uses a Controller Area Network with a proposed protocol for each device. The developed system is reconfigurable allowing to test different powertrain configurations. Also, the system can be useful in the implementation of control laws, energy management strategies or vehicle-to-grid or to-home applications.

Idioma originalInglés
Título de la publicación alojadaProceedings
Subtítulo de la publicación alojadaIECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas3021-3026
Número de páginas6
ISBN (versión digital)9781509066841
DOI
EstadoPublicada - 26 dic 2018
Publicado de forma externa
Evento44th Annual Conference of the IEEE Industrial Electronics Society, IECON 2018 - Washington, Estados Unidos
Duración: 20 oct 201823 oct 2018

Serie de la publicación

NombreProceedings: IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society

Conferencia

Conferencia44th Annual Conference of the IEEE Industrial Electronics Society, IECON 2018
PaísEstados Unidos
CiudadWashington
Período20/10/1823/10/18

    Huella digital

Citar esto

Diaz-Diaz, I. A., Zuñiga-Ventura, Y. A., Cervantes, I., & Villa-Villaseñor, N. (2018). Design of a test bed for teaching/research purposes in PHEVs. En Proceedings: IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society (pp. 3021-3026). [8591384] (Proceedings: IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IECON.2018.8591384