Crystallization of SbTe phase change optical films

E. Morales-Sánchez, E. Prokhorov, J. González-Hernández, M. A. Hernández-Landaverde, B. Chao

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Resumen

The aim of this work was to investigate the crystallization properties and crystallization temperature in SbTe thin films, with different content of Sb, using DSC, optical reflection at 650 nm and XRD measurements. DSC studies showed that crystallization temperature of the films depend on the Sb content. XRD measurements have shown that films with low Sb contents (less that 73 at %) directly crystallized in orthorhombic Sb2nTe3 and films with higher Sb contents first crystallized in rhombohedral Sb phase and at more high temperature appear Sb2nTe3 stable crystalline phase. Optical measurements showed a gradual increase of reflectivity with the temperature depending on the Sb content. The results of this research show that it is possible to obtain mixtures with different crystallization temperatures, changing the Sb content in the SbTe alloys.

Idioma originalInglés
Título de la publicación alojada2007 4th International Conference on Electrical and Electronics Engineering, ICEEE 2007
Páginas330-332
Número de páginas3
DOI
EstadoPublicada - 2007
Publicado de forma externa
Evento2007 4th International Conference on Electrical and Electronics Engineering, ICEEE 2007 - Mexico City, México
Duración: 5 sep. 20077 sep. 2007

Serie de la publicación

Nombre2007 4th International Conference on Electrical and Electronics Engineering, ICEEE 2007

Conferencia

Conferencia2007 4th International Conference on Electrical and Electronics Engineering, ICEEE 2007
País/TerritorioMéxico
CiudadMexico City
Período5/09/077/09/07

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