Ultra-low noise strained Si/SiGe n- and Ge/SiGe p-MODFETs

M. Enciso, F. Aniel, P. Crozat, L. Giguerre, R. Adde, M. Zeuner, G. Höck, A. Fox

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

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Engineering & Materials Science