Two ways of porous Si photoluminescence excitation

T. V. Torchinskaya, N. B. Korsunskaya, L. Yu Khomenkova, M. K. Sheinkman, N. P. Baran, A. Misiuk, B. Surma, B. Dzhumaev

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

The mechanism of photoluminescence excitation (PLE) in porous silicon (PS) is studied. The investigation of the PS aging process by photoluminescence (PL), PLE, EPR, Auger, FTIR and SIMS methods show that two PLE bands correspond to different substances on a silicon wire surface. One of them is the species which is desorbed during aging with an activation energy ≈ 0.5-0.6 eV. The energy transfer from this species (absorption centers) to luminescence centers which may be located in Si wire, Si/SiO interface or silicon oxide, is supposed. The nature of this species is discussed. The second substance is silicon oxide, probably.

Original languageEnglish
Pages (from-to)162-165
Number of pages4
JournalMaterials Science and Engineering B: Solid-State Materials for Advanced Technology
Volume51
Issue number1-3
DOIs
StatePublished - 27 Feb 1998
Externally publishedYes

Keywords

  • Absorption center
  • Photoluminescence excitation
  • Porous silicon

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