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The use of extinction phenomenon for investigation of textured thin film microstructure
T. Kryshtab
,
A. Kryvko
Escuela Superior de Física y Matemáticas (ESFM)
Escuela Superior de Ingeniería Mecánica y Eléctrica (ESIME), Unidad Zacatenco
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Engineering & Materials Science
Thin films
100%
Microstructure
71%
Poles
45%
Diffractometers
35%
Crystal microstructure
33%
Doping (additives)
29%
Superconducting transition temperature
28%
Phase transitions
27%
X ray diffraction
26%
Scattering
24%
X rays
23%
Radiation
20%
Physics & Astronomy
extinction
89%
microstructure
62%
thin films
54%
disorientation
38%
poles
23%
evaluation
16%
diffractometers
14%
x rays
11%
transition temperature
10%
radiation
7%
coefficients
7%
diffraction
7%
scattering
6%
crystals
6%
Chemistry
Microstructure
71%
Crystal Microstructure
40%
Domain Boundary
39%
Liquid Film
38%
Phase Transition Temperature
29%
X-Ray Diffraction Method
27%
Doping Material
23%
Reflection
21%
Shape
17%
X-Ray
16%
Length
15%