@inproceedings{aa065d25cc464c24b0a3adacbc7e1b4a,
title = "Synthesis and Atomic Force Microscopy contact current images of aluminum doped ZnO thin films",
abstract = "Aluminum doped ZnO thin films were synthesized by the water-mist assisted spray pyrolysis technique. The structural characterization by means of X-Ray diffraction measurements is reported. By means of Atomic Force Microscopy, the superficial electrical characteristics of the thin films are studied. Specifically, contact current images are shown and discussed. It is important to emphasize that in spite of no voltage is applied to the Atomic Force Microscopy contact conductive tip, current images are getting.",
keywords = "Atomic force microscopy, C-AFM, Zno thin films",
author = "Aguirre, {N. Mu{\~n}oz} and L{\'o}pez, {J. E.Rivera} and P{\'e}rez, {L. Mart{\'i}nez} and Meza, {P. Tamayo}",
year = "2010",
doi = "10.4028/www.scientific.net/MSF.644.109",
language = "Ingl{\'e}s",
isbn = "087849281X",
series = "Materials Science Forum",
publisher = "Trans Tech Publications Ltd",
pages = "109--112",
booktitle = "Advanced Electron Microscopy and Nanomaterials",
note = "1st Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials, AEM-NANOMAT'09 ; Conference date: 29-09-2009 Through 02-10-2009",
}