Synthesis and Atomic Force Microscopy contact current images of aluminum doped ZnO thin films

N. Muñoz Aguirre, J. E.Rivera López, L. Martínez Pérez, P. Tamayo Meza

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

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Resumen

Aluminum doped ZnO thin films were synthesized by the water-mist assisted spray pyrolysis technique. The structural characterization by means of X-Ray diffraction measurements is reported. By means of Atomic Force Microscopy, the superficial electrical characteristics of the thin films are studied. Specifically, contact current images are shown and discussed. It is important to emphasize that in spite of no voltage is applied to the Atomic Force Microscopy contact conductive tip, current images are getting.

Idioma originalInglés
Título de la publicación alojadaAdvanced Electron Microscopy and Nanomaterials
EditorialTrans Tech Publications Ltd
Páginas109-112
Número de páginas4
ISBN (versión impresa)087849281X, 9780878492817
DOI
EstadoPublicada - 2010
Evento1st Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials, AEM-NANOMAT'09 - Saltillo, Coahuila, México
Duración: 29 sep. 20092 oct. 2009

Serie de la publicación

NombreMaterials Science Forum
Volumen644
ISSN (versión impresa)0255-5476
ISSN (versión digital)1662-9752

Conferencia

Conferencia1st Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials, AEM-NANOMAT'09
País/TerritorioMéxico
CiudadSaltillo, Coahuila
Período29/09/092/10/09

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