@inproceedings{b0dcfe2fdb9e4d72a64e4d60fa072fd8,
title = "Structural characterization by HRXRD and Raman scattering of Al xGa1-xSb/GaSb heterostructure",
abstract = "High resolution X-ray diffraction profiles were obtained from Al xGa1-xSb layers grown on (001) GaSb substrates by Liquid Phase Epitaxy (LPE). The out of plane lattice parameter was estimated directly from the asymmetrical diffractions (115) and (-1-15) alloy. These results show that some of the layers are more strained than others. The out of plane lattice parameter as a function of Al content is higher than the corresponding bulk lattice parameter of AlxGa1-xSb layers obtained with Vegard's law. Two peaks are observed in their Raman spectra over this composition range. The assignment of the observed modes to GaSb-like is discussed.",
keywords = "AlGaSb, Liquid phase epitaxy, Raman scattering, Ternary alloy, X-ray diffraction",
author = "A. Mendez-Lopez and J. Diaz-Reyes and J. Martinez-Juarez and M. Galv{\'a}n-Arellano",
year = "2010",
language = "Ingl{\'e}s",
isbn = "9789604742486",
series = "Advances in Sensors, Signals and Materials - 3rd WSEAS International Conference on Sensors and Signals, SENSIG'10, 3rd WSEAS International Conference on Materials Science, MATERIALS'10",
publisher = "World Scientific and Engineering Academy and Society",
pages = "110--114",
booktitle = "Advances in Sensors, Signals and Materials - 3rd WSEAS International Conference on Sensors and Signals, SENSIG'10, 3rd WSEAS International Conference on Materials Science, MATERIALS'10",
address = "Grecia",
}