Strategy to replace the damaged power device for fault-tolerant induction motor drive

M. A. Rodríguez, A. Claudio, D. Theilliol, L. G. Vela, L. Hernández

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations

Abstract

In this paper, the most suitable time to replace to the damaged element in open-loop and closed-loop control for the fault-tolerant induction motor drive system is presented, with a previous stage of fault-diagnostic to detect a short-circuit or open-circuit failure in the power device. The technique is based on the connection of bidirectional switches to isolate electrically the damaged element by mean of fuse blown corresponding, to activate another bidirectional switch to replace only the damaged device by another healthful one. Simulation and experimental results are obtained in order to validate the technique proposed which is based on replacing the damaged element at the most suitable moment in order to decrease the tracking error of the motor current during the fault transient. 02009 IEEE.

Original languageEnglish
Title of host publication24th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2009
Pages343-346
Number of pages4
DOIs
StatePublished - 2009
Event24th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2009 - Washington, DC, United States
Duration: 15 Feb 200919 Feb 2009

Publication series

NameConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Conference

Conference24th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2009
Country/TerritoryUnited States
CityWashington, DC
Period15/02/0919/02/09

Keywords

  • Fault tolerant
  • Induction motor drive
  • Replacement of damaged element
  • Tolerant mechanism

Fingerprint

Dive into the research topics of 'Strategy to replace the damaged power device for fault-tolerant induction motor drive'. Together they form a unique fingerprint.

Cite this