Strategy to replace the damaged power device for fault-tolerant induction motor drive

M. A. Rodríguez, A. Claudio, D. Theilliol, L. G. Vela, L. Hernández

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

6 Citas (Scopus)

Resumen

In this paper, the most suitable time to replace to the damaged element in open-loop and closed-loop control for the fault-tolerant induction motor drive system is presented, with a previous stage of fault-diagnostic to detect a short-circuit or open-circuit failure in the power device. The technique is based on the connection of bidirectional switches to isolate electrically the damaged element by mean of fuse blown corresponding, to activate another bidirectional switch to replace only the damaged device by another healthful one. Simulation and experimental results are obtained in order to validate the technique proposed which is based on replacing the damaged element at the most suitable moment in order to decrease the tracking error of the motor current during the fault transient. 02009 IEEE.

Idioma originalInglés
Título de la publicación alojada24th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2009
Páginas343-346
Número de páginas4
DOI
EstadoPublicada - 2009
Evento24th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2009 - Washington, DC, Estados Unidos
Duración: 15 feb. 200919 feb. 2009

Serie de la publicación

NombreConference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Conferencia

Conferencia24th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2009
País/TerritorioEstados Unidos
CiudadWashington, DC
Período15/02/0919/02/09

Huella

Profundice en los temas de investigación de 'Strategy to replace the damaged power device for fault-tolerant induction motor drive'. En conjunto forman una huella única.

Citar esto