Stoichiometry Calculation in BaxSr1- xTiO3 Solid Solution Thin Films, Prepared by RF Cosputtering, Using X-Ray Diffraction Peak Positions and Boltzmann Sigmoidal Modelling

J. Reséndiz-Muñoz, J. L. Fernández-Muñoz, M. A. Corona-Rivera, M. Zapata-Torres, A. Márquez-Herrera, M. Meléndez-Lira, F. Caballero-Briones, F. Chale-Lara, O. Zelaya-Ángel

Research output: Contribution to journal › Article › peer-review

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Chemistry