SiGe HBT featuringfr- > 600GHz at cryogenic temperature

N. Zerounian, E. Ramirez Garcia, F. Aniel, P. Chevalier, B. Geynet, A. Chantre

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

9 Scopus citations

Abstract

A comparison of electrical performances of state-of-the-art SiGe heterojunction bipolar transistors at low temperature is presented. The performances increase results from the diminution of transit times thanks to the rise of non-stationary transport, the relative increase of the transconductance with the reduction of self-heating effects, and the decrease of access resistances.

Original languageEnglish
Title of host publicationECS Transactions - SiGe, Ge, and Related Compounds 3
Subtitle of host publicationMaterials, Processing, and Devices
PublisherElectrochemical Society Inc.
Pages1069-1077
Number of pages9
Edition10
ISBN (Print)9781566776561
DOIs
StatePublished - 2008
Externally publishedYes
Event3rd SiGe, Ge, and Related Compounds: Materials, Processing and Devices Symposium - 214th ECS Meeting - Honolulu, HI, United States
Duration: 12 Oct 200817 Oct 2008

Publication series

NameECS Transactions
Number10
Volume16
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

Conference3rd SiGe, Ge, and Related Compounds: Materials, Processing and Devices Symposium - 214th ECS Meeting
Country/TerritoryUnited States
CityHonolulu, HI
Period12/10/0817/10/08

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