Photoluminescence of as-grown and thermal annealed SiOx/Si- nanocrystals heterolayers grown by reactive rf sputtering

E. Mota-Pineda, M. Meléndez-Lira, M. Zapata-Torres, P. Del Angel, A. Pérez-Centeno, S. Jiménez-Sandoval, M. A. Santana-Aranda

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Abstract

SiOx/Si -nanocrystals (Si NCs) heterolayers were fabricated employing a rf magnetron sputtering system. The synthesis process, through modification of the oxygen partial pressure of the plasma, promotes the synthesis of stoichiometric SiO2 layers and affect the Si NCs layer giving place to SiOx /Si NCs (1.64<x<2) interfaces. All as-grown samples showed strong photoluminescence (PL) bands in the visible and near-infrared regions; transmission electron microscopy measurements confirmed the presence of Si NCs. Thermal annealing at 1100 °C promoted the SiO 2 stoichiometry in the interface and the crystallization of more Si NCs. The results allow us to clearly identify the origin of the PL bands; indicating that the near-infrared emission is related to the nonstoichiometric oxide while the red and green bands are originated in Si NCs.

Original languageEnglish
Article number094323
JournalJournal of Applied Physics
Volume108
Issue number9
DOIs
StatePublished - 1 Nov 2010
Externally publishedYes

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