Passivation properties of nitric/phosphoric etching on CdTe films: Influence of the etching time and nitric acid concentration

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Abstract

The chemical etch of CdTe surfaces with a mixture of phosphoric and nitric acids is used in research labs in order to enhance the back-contact formation in CdS/CdTe solar cells. However, the possible passivation effect of this approach has not been studied. In this work we report an investigation about the etching effect of nitric/phosphoric acid mixtures with different etching times (0, 30, 40 and 50 s) and variable concentrations of the nitric acid upon the surface recombination velocity of CdTe films deposited by close space vapor transport. Surface recombination velocities with values as low as 93 cm/s were achieved.

Translated title of the contributionPropiedades de pasivación del grabado nítrico/fosfórico en películas de CdTe: influencia del tiempo de grabado y la concentración de ácido nítrico
Original languageEnglish
Pages (from-to)7164-7167
Number of pages4
JournalThin Solid Films
Volume519
Issue number21
DOIs
StatePublished - 31 Aug 2011

Keywords

  • CdTe
  • Passivation
  • Photoacoustic
  • Photoluminescence
  • Surface recombination velocity
  • Thin film

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