Nanometric structures of highly oriented zinc blende ZnO thin films

L. Martínez-Pérez; N. Muñoz-Aguirre; S. Muñoz-Aguirre; O. Zelaya-Angel

doi:10.1016/j.matlet.2014.10.054

Nanometric structures of highly oriented zinc blende ZnO thin films

L. Martínez-Pérez, N. Muñoz-Aguirre, S. Muñoz-Aguirre, O. Zelaya-Angel

Escuela Superior de Ingeniería Mecánica y Eléctrica (ESIME), Unidad Azcapotzalco

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

Zinc oxide thin films in cubic zinc blende (ZB) crystalline phase on glass substrates by means of the spray pyrolysis technique were deposited. X-ray diffraction spectra revealed that the ZB-ZnO films grow highly oriented along the (004) crystalline direction with no epitaxial influence. Optical absorbance measurements indicated that the forbidden energy band gap is 3.18±0.02 eV in accordance with reports on the experimental value of the band gap of ZB-ZnO structures. Atomic Force Microscopy images exhibit nanometric structures of the surface with the approximated aspect of circular nanodiscs. The thickness of the thin films is 350±20 nm, which suggests a good stability of the films.

Original language	English
Pages (from-to)	63-65
Number of pages	3
Journal	Materials Letters
Volume	139
DOIs	https://doi.org/10.1016/j.matlet.2014.10.054
State	Published - 15 Jan 2015

Keywords

Atomic Force Microscopy
Cristal structure
Deposition
Microstructure
Phase transformation
Thin films

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10.1016/j.matlet.2014.10.054

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title = "Nanometric structures of highly oriented zinc blende ZnO thin films",

abstract = "Zinc oxide thin films in cubic zinc blende (ZB) crystalline phase on glass substrates by means of the spray pyrolysis technique were deposited. X-ray diffraction spectra revealed that the ZB-ZnO films grow highly oriented along the (004) crystalline direction with no epitaxial influence. Optical absorbance measurements indicated that the forbidden energy band gap is 3.18±0.02 eV in accordance with reports on the experimental value of the band gap of ZB-ZnO structures. Atomic Force Microscopy images exhibit nanometric structures of the surface with the approximated aspect of circular nanodiscs. The thickness of the thin films is 350±20 nm, which suggests a good stability of the films.",

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TY - JOUR

T1 - Nanometric structures of highly oriented zinc blende ZnO thin films

AU - Martínez-Pérez, L.

AU - Muñoz-Aguirre, N.

AU - Muñoz-Aguirre, S.

AU - Zelaya-Angel, O.

PY - 2015/1/15

Y1 - 2015/1/15

N2 - Zinc oxide thin films in cubic zinc blende (ZB) crystalline phase on glass substrates by means of the spray pyrolysis technique were deposited. X-ray diffraction spectra revealed that the ZB-ZnO films grow highly oriented along the (004) crystalline direction with no epitaxial influence. Optical absorbance measurements indicated that the forbidden energy band gap is 3.18±0.02 eV in accordance with reports on the experimental value of the band gap of ZB-ZnO structures. Atomic Force Microscopy images exhibit nanometric structures of the surface with the approximated aspect of circular nanodiscs. The thickness of the thin films is 350±20 nm, which suggests a good stability of the films.

AB - Zinc oxide thin films in cubic zinc blende (ZB) crystalline phase on glass substrates by means of the spray pyrolysis technique were deposited. X-ray diffraction spectra revealed that the ZB-ZnO films grow highly oriented along the (004) crystalline direction with no epitaxial influence. Optical absorbance measurements indicated that the forbidden energy band gap is 3.18±0.02 eV in accordance with reports on the experimental value of the band gap of ZB-ZnO structures. Atomic Force Microscopy images exhibit nanometric structures of the surface with the approximated aspect of circular nanodiscs. The thickness of the thin films is 350±20 nm, which suggests a good stability of the films.

KW - Atomic Force Microscopy

KW - Cristal structure

KW - Deposition

KW - Microstructure

KW - Phase transformation

KW - Thin films

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U2 - 10.1016/j.matlet.2014.10.054

DO - 10.1016/j.matlet.2014.10.054

M3 - Artículo

SN - 0167-577X

VL - 139

SP - 63

EP - 65

JO - Materials Letters

JF - Materials Letters

ER -

Nanometric structures of highly oriented zinc blende ZnO thin films

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Keywords

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