Nanometric structures of highly oriented zinc blende ZnO thin films

L. Martínez-Pérez; N. Muñoz-Aguirre; S. Muñoz-Aguirre; O. Zelaya-Angel

doi:10.1016/j.matlet.2014.10.054

Nanometric structures of highly oriented zinc blende ZnO thin films

L. Martínez-Pérez, N. Muñoz-Aguirre, S. Muñoz-Aguirre, O. Zelaya-Angel

Escuela Superior de Ingeniería Mecánica y Eléctrica (ESIME), Unidad Azcapotzalco

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

9 Citas (Scopus)

Resumen

Zinc oxide thin films in cubic zinc blende (ZB) crystalline phase on glass substrates by means of the spray pyrolysis technique were deposited. X-ray diffraction spectra revealed that the ZB-ZnO films grow highly oriented along the (004) crystalline direction with no epitaxial influence. Optical absorbance measurements indicated that the forbidden energy band gap is 3.18±0.02 eV in accordance with reports on the experimental value of the band gap of ZB-ZnO structures. Atomic Force Microscopy images exhibit nanometric structures of the surface with the approximated aspect of circular nanodiscs. The thickness of the thin films is 350±20 nm, which suggests a good stability of the films.

Idioma original	Inglés
Páginas (desde-hasta)	63-65
Número de páginas	3
Publicación	Materials Letters
Volumen	139
DOI	https://doi.org/10.1016/j.matlet.2014.10.054
Estado	Publicada - 15 ene. 2015

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title = "Nanometric structures of highly oriented zinc blende ZnO thin films",

abstract = "Zinc oxide thin films in cubic zinc blende (ZB) crystalline phase on glass substrates by means of the spray pyrolysis technique were deposited. X-ray diffraction spectra revealed that the ZB-ZnO films grow highly oriented along the (004) crystalline direction with no epitaxial influence. Optical absorbance measurements indicated that the forbidden energy band gap is 3.18±0.02 eV in accordance with reports on the experimental value of the band gap of ZB-ZnO structures. Atomic Force Microscopy images exhibit nanometric structures of the surface with the approximated aspect of circular nanodiscs. The thickness of the thin films is 350±20 nm, which suggests a good stability of the films.",

keywords = "Atomic Force Microscopy, Cristal structure, Deposition, Microstructure, Phase transformation, Thin films",

author = "L. Mart{\'i}nez-P{\'e}rez and N. Mu{\~n}oz-Aguirre and S. Mu{\~n}oz-Aguirre and O. Zelaya-Angel",

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T1 - Nanometric structures of highly oriented zinc blende ZnO thin films

AU - Martínez-Pérez, L.

AU - Muñoz-Aguirre, N.

AU - Muñoz-Aguirre, S.

AU - Zelaya-Angel, O.

PY - 2015/1/15

Y1 - 2015/1/15

N2 - Zinc oxide thin films in cubic zinc blende (ZB) crystalline phase on glass substrates by means of the spray pyrolysis technique were deposited. X-ray diffraction spectra revealed that the ZB-ZnO films grow highly oriented along the (004) crystalline direction with no epitaxial influence. Optical absorbance measurements indicated that the forbidden energy band gap is 3.18±0.02 eV in accordance with reports on the experimental value of the band gap of ZB-ZnO structures. Atomic Force Microscopy images exhibit nanometric structures of the surface with the approximated aspect of circular nanodiscs. The thickness of the thin films is 350±20 nm, which suggests a good stability of the films.

AB - Zinc oxide thin films in cubic zinc blende (ZB) crystalline phase on glass substrates by means of the spray pyrolysis technique were deposited. X-ray diffraction spectra revealed that the ZB-ZnO films grow highly oriented along the (004) crystalline direction with no epitaxial influence. Optical absorbance measurements indicated that the forbidden energy band gap is 3.18±0.02 eV in accordance with reports on the experimental value of the band gap of ZB-ZnO structures. Atomic Force Microscopy images exhibit nanometric structures of the surface with the approximated aspect of circular nanodiscs. The thickness of the thin films is 350±20 nm, which suggests a good stability of the films.

KW - Atomic Force Microscopy

KW - Cristal structure

KW - Deposition

KW - Microstructure

KW - Phase transformation

KW - Thin films

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U2 - 10.1016/j.matlet.2014.10.054

DO - 10.1016/j.matlet.2014.10.054

M3 - Artículo

SN - 0167-577X

VL - 139

SP - 63

EP - 65

JO - Materials Letters

JF - Materials Letters

ER -

Nanometric structures of highly oriented zinc blende ZnO thin films

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