TY - GEN
T1 - IGBT fault diagnosis using adaptive thresholds during the turn-on transient
AU - Rodriguez-Blanco, M. A.
AU - Vazquez-Perez, A.
AU - Hernandez-Gonzalez, L.
AU - Pech-Carbonell, A.
AU - May-Alarcon, M.
PY - 2013
Y1 - 2013
N2 - This paper presents the design of an electronic fault detection circuit in the insulated gate bipolar transistor (IGBT) based on the exclusive measurement of the gate signal during the turn-on transient. In order to increase the effectiveness of the detection and to tolerate the variations of input to system, adaptable thresholds have been added to the circuit. There are three important aspects in this research, specifically: 1 - Early detection, since the evaluation is realized during the turn-on transient; 2 - Reducing false alarms, because the variations of input to the system are considered; 3 - A realistic design, since the components used are commercially available, and the IGBT model used is the standard for PSpice software which has already been widely validated in the literature.
AB - This paper presents the design of an electronic fault detection circuit in the insulated gate bipolar transistor (IGBT) based on the exclusive measurement of the gate signal during the turn-on transient. In order to increase the effectiveness of the detection and to tolerate the variations of input to system, adaptable thresholds have been added to the circuit. There are three important aspects in this research, specifically: 1 - Early detection, since the evaluation is realized during the turn-on transient; 2 - Reducing false alarms, because the variations of input to the system are considered; 3 - A realistic design, since the components used are commercially available, and the IGBT model used is the standard for PSpice software which has already been widely validated in the literature.
KW - Adaptable Thresholds
KW - FDI System
KW - Fault Detection
KW - Insulated Gate Bipolar Transistor (IGBT) and Motor Inverter System
UR - http://www.scopus.com/inward/record.url?scp=84891093379&partnerID=8YFLogxK
U2 - 10.1109/DEMPED.2013.6645723
DO - 10.1109/DEMPED.2013.6645723
M3 - Contribución a la conferencia
AN - SCOPUS:84891093379
SN - 9781479900251
T3 - Proceedings - 2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives, SDEMPED 2013
SP - 241
EP - 248
BT - Proceedings - 2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives, SDEMPED 2013
PB - IEEE Computer Society
T2 - 2013 9th IEEE International Symposium on Diagnostics for Electric Machines, Power Electronics and Drives, SDEMPED 2013
Y2 - 27 August 2013 through 30 August 2013
ER -