Exciton-polariton coupling and enhanced emission in SiC nanocrystals

Georgiy Polupan, Miguel Morales-Rodriguez

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The paper presents the results of 6H-SiC nanocrystals (NCs) characterization using atomic force microscope (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD) and photoluminescence spectroscopy techniques. XRD study shows the investigated porous 6H-SiC layers contain inclusions of 4H-SiC and 15R-SiC polytypes. Photoluminescence study of porous SiC layers with different thicknesses and SiC NC sizes (50-250 nm) reveals the intensity stimulation of exciton related PL bands in different SiC polytypes. The intensity enhancement for excitonrelated PL bands is attributed to the exciton recombination rate increasing due to the realization of exciton-polariton effects in big size SiC NCs of different polytypes (6H-PSiC with inclusions of 15R- and 4H-PSiC).

Original languageEnglish
Title of host publicationNanoengineering
Subtitle of host publicationFabrication, Properties, Optics, and Devices VIII
DOIs
StatePublished - 2011
EventNanoengineering: Fabrication, Properties, Optics, and Devices VIII - San Diego, CA, United States
Duration: 23 Aug 201124 Aug 2011

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8102
ISSN (Print)0277-786X

Conference

ConferenceNanoengineering: Fabrication, Properties, Optics, and Devices VIII
Country/TerritoryUnited States
CitySan Diego, CA
Period23/08/1124/08/11

Keywords

  • Exciton-light coupling
  • Oscillation strength
  • Recombination time
  • SiC nanocrystals
  • Stimulated emission
  • Weak quantum confinement

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