Exciton-polariton coupling and enhanced emission in SiC nanocrystals

Georgiy Polupan, Miguel Morales-Rodriguez

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

The paper presents the results of 6H-SiC nanocrystals (NCs) characterization using atomic force microscope (AFM), scanning electron microscopy (SEM), X-ray diffraction (XRD) and photoluminescence spectroscopy techniques. XRD study shows the investigated porous 6H-SiC layers contain inclusions of 4H-SiC and 15R-SiC polytypes. Photoluminescence study of porous SiC layers with different thicknesses and SiC NC sizes (50-250 nm) reveals the intensity stimulation of exciton related PL bands in different SiC polytypes. The intensity enhancement for excitonrelated PL bands is attributed to the exciton recombination rate increasing due to the realization of exciton-polariton effects in big size SiC NCs of different polytypes (6H-PSiC with inclusions of 15R- and 4H-PSiC).

Idioma originalInglés
Título de la publicación alojadaNanoengineering
Subtítulo de la publicación alojadaFabrication, Properties, Optics, and Devices VIII
DOI
EstadoPublicada - 2011
EventoNanoengineering: Fabrication, Properties, Optics, and Devices VIII - San Diego, CA, Estados Unidos
Duración: 23 ago. 201124 ago. 2011

Serie de la publicación

NombreProceedings of SPIE - The International Society for Optical Engineering
Volumen8102
ISSN (versión impresa)0277-786X

Conferencia

ConferenciaNanoengineering: Fabrication, Properties, Optics, and Devices VIII
País/TerritorioEstados Unidos
CiudadSan Diego, CA
Período23/08/1124/08/11

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