Electrical stress in CdS thin film transistors using HfO2 gate dielectric

R. García, I. Mejia, J. E. Molinar-Solis, A. L. Salas-Villasenor, A. Morales, B. García, M. A. Quevedo-Lopez, M. Alemán

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

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Physics & Astronomy