Engineering & Materials Science
Annealing
20%
Defects
28%
Excitons
36%
Hot Temperature
9%
Nanocrystals
61%
Nitrogen
19%
Optical transitions
43%
Photoluminescence
100%
Plasma enhanced chemical vapor deposition
29%
Raman scattering
29%
Silicon
16%
Silicon nitride
74%
Stoichiometry
82%
Structural properties
66%
Substrates
14%
Temperature
8%
Thin films
58%
Transmission electron microscopy
21%
Physics & Astronomy
annealing
12%
defects
22%
excitons
16%
nanocrystals
36%
nitrogen
15%
optical transition
21%
photoluminescence
43%
Raman spectra
15%
silicon
11%
silicon nitrides
60%
stoichiometry
59%
temperature dependence
13%
thin films
31%
transmission electron microscopy
13%
vapor deposition
15%
Chemistry
Annealing
16%
Exciton
20%
Flow
13%
Liquid Film
29%
Nanocrystal
33%
Nitride
59%
Nitrogen
12%
Optical Transition
28%
Photoluminescence
47%
Photoluminescence Spectrum
20%
Plasma Enhanced Chemical Vapour Deposition
24%
Reaction Stoichiometry
50%
Transmission Electron Microscopy
13%