TY - JOUR
T1 - Effect of indium tin oxide substrate roughness on the morphology, structural and optical properties of CdS thin films
AU - Castro-Rodríguez, R.
AU - Oliva, A. I.
AU - Sosa, Victor
AU - Caballero-Briones, F.
AU - Peña, J. L.
N1 - Funding Information:
The authors acknowledge the technical support of Roberto Sánchez, Mario Herrera, Vı́ctor Rejón, Oswaldo Gómez, Wilian Cauich, Emilio Corona, and the secretarial assistance of Carmen Simón and Lourdes Pinelo. This work was supported by CONACYT-México through the project number 28778-E.
PY - 2000/7/2
Y1 - 2000/7/2
N2 - Indium tin oxide (ITO) coatings of glass substrates were etched with hydrochloric acid in order to obtain different root-mean-square roughness (RITO) on its surface. The effect of RITO on the morphology, structural and optical properties of CdS films deposited was investigated. Polycrystalline cadmium sulfide thin films were deposited on ITO/glass substrates by chemical-bath deposition (CBD) at 358 K, and studied by atomic force microscopy (AFM). Roughness of CdS films (RCdS) showed a nearly linear increase with RITO. The thickness of CdS films was investigated by Auger Electron Spectroscopy (AES) and showed an increment with RCdS. X-ray diffraction results showed that CdS films have a cubic zincblende structure with a (111) preferred orientation. The measured residual strain of the CdS films showed an initial increase with RITO reaching a maximum point at 15±2 nm, and after that exhibited a decreasing dependence. The optical band gap Eo of the CdS films obtained from transmittance measurements did not depend on RITO.
AB - Indium tin oxide (ITO) coatings of glass substrates were etched with hydrochloric acid in order to obtain different root-mean-square roughness (RITO) on its surface. The effect of RITO on the morphology, structural and optical properties of CdS films deposited was investigated. Polycrystalline cadmium sulfide thin films were deposited on ITO/glass substrates by chemical-bath deposition (CBD) at 358 K, and studied by atomic force microscopy (AFM). Roughness of CdS films (RCdS) showed a nearly linear increase with RITO. The thickness of CdS films was investigated by Auger Electron Spectroscopy (AES) and showed an increment with RCdS. X-ray diffraction results showed that CdS films have a cubic zincblende structure with a (111) preferred orientation. The measured residual strain of the CdS films showed an initial increase with RITO reaching a maximum point at 15±2 nm, and after that exhibited a decreasing dependence. The optical band gap Eo of the CdS films obtained from transmittance measurements did not depend on RITO.
UR - http://www.scopus.com/inward/record.url?scp=0038196298&partnerID=8YFLogxK
U2 - 10.1016/S0169-4332(99)00574-7
DO - 10.1016/S0169-4332(99)00574-7
M3 - Artículo
SN - 0169-4332
VL - 161
SP - 340
EP - 346
JO - Applied Surface Science
JF - Applied Surface Science
IS - 3
ER -