Characterization of deep-level defects and their connection with the performance of InxGa1-xAs/InP p-i-n photodiodes

Tatyana V. Torchinskaya, Volodya I. Kooshnirenko, Ludmila V. Shcherbina, Carla J. Miner

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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