Abstract
In the present work Bi thin films were obtained by Pulsed Laser Deposition (PLD), using Nd:YAG laser. The films were characterized by optical microscopy. Raman spectroscopy and X-rays diffraction. It was accomplished the real time spectral emission characterization of the plasma generated during the laser evaporation process. Highly oriented thin films were obtained.
| Original language | English |
|---|---|
| Pages (from-to) | 70-73 |
| Number of pages | 4 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3572 |
| State | Published - 1999 |
| Externally published | Yes |
| Event | Proceedings of the 1998 3rd Iberoamerican Optics Meeting (RIAO) and 6th Latin American Meeting on Optics, Lasers, and their Application (OPTILAS) - Cartagena de Indias, Colombia Duration: 28 Sep 1998 → 2 Oct 1998 |