Bismuth thin films obtained by Pulsed Laser Deposition

T. Flores; M. Arronte; E. Rodriguez; L. Ponce; J. C. Alonso; C. Garcia; M. Fernandez; E. Haro

Bismuth thin films obtained by Pulsed Laser Deposition

T. Flores, M. Arronte, E. Rodriguez, L. Ponce, J. C. Alonso, C. Garcia, M. Fernandez, E. Haro

Producción científica: Contribución a una revista › Artículo de la conferencia › revisión exhaustiva

Resumen

In the present work Bi thin films were obtained by Pulsed Laser Deposition (PLD), using Nd:YAG laser. The films were characterized by optical microscopy. Raman spectroscopy and X-rays diffraction. It was accomplished the real time spectral emission characterization of the plasma generated during the laser evaporation process. Highly oriented thin films were obtained.

Idioma original	Inglés
Páginas (desde-hasta)	70-73
Número de páginas	4
Publicación	Proceedings of SPIE - The International Society for Optical Engineering
Volumen	3572
Estado	Publicada - 1999
Publicado de forma externa	Sí
Evento	Proceedings of the 1998 3rd Iberoamerican Optics Meeting (RIAO) and 6th Latin American Meeting on Optics, Lasers, and their Application (OPTILAS) - Cartagena de Indias, Colombia Duración: 28 sep. 1998 → 2 oct. 1998

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title = "Bismuth thin films obtained by Pulsed Laser Deposition",

abstract = "In the present work Bi thin films were obtained by Pulsed Laser Deposition (PLD), using Nd:YAG laser. The films were characterized by optical microscopy. Raman spectroscopy and X-rays diffraction. It was accomplished the real time spectral emission characterization of the plasma generated during the laser evaporation process. Highly oriented thin films were obtained.",

author = "T. Flores and M. Arronte and E. Rodriguez and L. Ponce and Alonso, {J. C.} and C. Garcia and M. Fernandez and E. Haro",

year = "1999",

language = "Ingl{\'e}s",

volume = "3572",

pages = "70--73",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

note = "Proceedings of the 1998 3rd Iberoamerican Optics Meeting (RIAO) and 6th Latin American Meeting on Optics, Lasers, and their Application (OPTILAS) ; Conference date: 28-09-1998 Through 02-10-1998",

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TY - JOUR

T1 - Bismuth thin films obtained by Pulsed Laser Deposition

AU - Flores, T.

AU - Arronte, M.

AU - Rodriguez, E.

AU - Ponce, L.

AU - Alonso, J. C.

AU - Garcia, C.

AU - Fernandez, M.

AU - Haro, E.

PY - 1999

Y1 - 1999

N2 - In the present work Bi thin films were obtained by Pulsed Laser Deposition (PLD), using Nd:YAG laser. The films were characterized by optical microscopy. Raman spectroscopy and X-rays diffraction. It was accomplished the real time spectral emission characterization of the plasma generated during the laser evaporation process. Highly oriented thin films were obtained.

AB - In the present work Bi thin films were obtained by Pulsed Laser Deposition (PLD), using Nd:YAG laser. The films were characterized by optical microscopy. Raman spectroscopy and X-rays diffraction. It was accomplished the real time spectral emission characterization of the plasma generated during the laser evaporation process. Highly oriented thin films were obtained.

UR - http://www.scopus.com/inward/record.url?scp=0032631064&partnerID=8YFLogxK

M3 - Artículo de la conferencia

AN - SCOPUS:0032631064

SN - 0277-786X

VL - 3572

SP - 70

EP - 73

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Proceedings of the 1998 3rd Iberoamerican Optics Meeting (RIAO) and 6th Latin American Meeting on Optics, Lasers, and their Application (OPTILAS)

Y2 - 28 September 1998 through 2 October 1998

ER -

Bismuth thin films obtained by Pulsed Laser Deposition

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