A study by GISAXS of PbTe/SiO2 multilayer deposited on Si(111)

G. Kellermann; E. Rodriguez; E. Jimenez; E. Chillcce; C. L. César; L. C. Barbosa

doi:10.1117/12.701082

A study by GISAXS of PbTe/SiO₂ multilayer deposited on Si(111)

G. Kellermann, E. Rodriguez, E. Jimenez, E. Chillcce, C. L. César, L. C. Barbosa

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Multilayers of PbTe quantum dots embedded in SiO₂ were fabricated by alternatively use of Laser Ablation and Plasma Enhanced Chemical Vapor Deposition techniques. A set o samples containing different PbTe nanoparticles sizes was prepared for the study. The morphological properties of the nanostructured material were studied by means of grazing-incidence small-angle X-ray scattering (GISAXS) and x-ray reflectometry (XRR) techniques. A preliminary analysis of the GISAXS spectra provided information about the multilayer periodicity and its relationship to the size of the deposited PbTe nanoparticles.

Original language	English
Title of host publication	Quantum Dots, Particles, and Nanoclusters IV
DOIs	https://doi.org/10.1117/12.701082
State	Published - 2007
Externally published	Yes
Event	Quantum Dots, Particles, and Nanoclusters IV - San Jose, CA, United States Duration: 22 Jan 2007 → 23 Jan 2007

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	6481
ISSN (Print)	0277-786X

Conference

Conference	Quantum Dots, Particles, and Nanoclusters IV
Country/Territory	United States
City	San Jose, CA
Period	22/01/07 → 23/01/07

Keywords

GISAXS
Optical device
PECVD
Pulsed laser deposition
Quantum dots

Access to Document

10.1117/12.701082

Cite this

@inproceedings{87c4a7e2c81246b49288375649c0af5d,

title = "A study by GISAXS of PbTe/SiO2 multilayer deposited on Si(111)",

abstract = "Multilayers of PbTe quantum dots embedded in SiO2 were fabricated by alternatively use of Laser Ablation and Plasma Enhanced Chemical Vapor Deposition techniques. A set o samples containing different PbTe nanoparticles sizes was prepared for the study. The morphological properties of the nanostructured material were studied by means of grazing-incidence small-angle X-ray scattering (GISAXS) and x-ray reflectometry (XRR) techniques. A preliminary analysis of the GISAXS spectra provided information about the multilayer periodicity and its relationship to the size of the deposited PbTe nanoparticles.",

keywords = "GISAXS, Optical device, PECVD, Pulsed laser deposition, Quantum dots",

author = "G. Kellermann and E. Rodriguez and E. Jimenez and E. Chillcce and C{\'e}sar, {C. L.} and Barbosa, {L. C.}",

year = "2007",

doi = "10.1117/12.701082",

language = "Ingl{\'e}s",

isbn = "0819465941",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

booktitle = "Quantum Dots, Particles, and Nanoclusters IV",

note = "Quantum Dots, Particles, and Nanoclusters IV ; Conference date: 22-01-2007 Through 23-01-2007",

}

Kellermann, G, Rodriguez, E, Jimenez, E, Chillcce, E, César, CL & Barbosa, LC 2007, A study by GISAXS of PbTe/SiO₂ multilayer deposited on Si(111). in Quantum Dots, Particles, and Nanoclusters IV., 64810A, Proceedings of SPIE - The International Society for Optical Engineering, vol. 6481, Quantum Dots, Particles, and Nanoclusters IV, San Jose, CA, United States, 22/01/07. https://doi.org/10.1117/12.701082

TY - GEN

T1 - A study by GISAXS of PbTe/SiO2 multilayer deposited on Si(111)

AU - Kellermann, G.

AU - Rodriguez, E.

AU - Jimenez, E.

AU - Chillcce, E.

AU - César, C. L.

AU - Barbosa, L. C.

PY - 2007

Y1 - 2007

N2 - Multilayers of PbTe quantum dots embedded in SiO2 were fabricated by alternatively use of Laser Ablation and Plasma Enhanced Chemical Vapor Deposition techniques. A set o samples containing different PbTe nanoparticles sizes was prepared for the study. The morphological properties of the nanostructured material were studied by means of grazing-incidence small-angle X-ray scattering (GISAXS) and x-ray reflectometry (XRR) techniques. A preliminary analysis of the GISAXS spectra provided information about the multilayer periodicity and its relationship to the size of the deposited PbTe nanoparticles.

AB - Multilayers of PbTe quantum dots embedded in SiO2 were fabricated by alternatively use of Laser Ablation and Plasma Enhanced Chemical Vapor Deposition techniques. A set o samples containing different PbTe nanoparticles sizes was prepared for the study. The morphological properties of the nanostructured material were studied by means of grazing-incidence small-angle X-ray scattering (GISAXS) and x-ray reflectometry (XRR) techniques. A preliminary analysis of the GISAXS spectra provided information about the multilayer periodicity and its relationship to the size of the deposited PbTe nanoparticles.

KW - GISAXS

KW - Optical device

KW - PECVD

KW - Pulsed laser deposition

KW - Quantum dots

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T3 - Proceedings of SPIE - The International Society for Optical Engineering

BT - Quantum Dots, Particles, and Nanoclusters IV

T2 - Quantum Dots, Particles, and Nanoclusters IV

Y2 - 22 January 2007 through 23 January 2007

ER -