0.3 dB minimum noise figure at 2.5 GHz of 0.13 μm Si/Si0.58Ge0.42 n-MODFETs

M. Enciso, F. Aniel, P. Crozat, R. Adde, M. Zeuner, A. Fox, T. Hackbarth

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

RF and microwave noise performances of strained Si/Si0.58Ge0.42 n-MODFETs are presented for the first time. The 0.13 μm gate devices have de-embedded fT = 49 GHz, fmax = 70 GHz and a record intrinsic gm = 700 mS/mm. A de-embedded minimum noise figure NFmin = 0.3 dB with a 41 Ω noise resistance Rn and a 19 dB associated gain Gass are obtained at 2.5 GHz, while NFmin = 2.0 dB with Gass = 10 dB at 18 GHz. The noise parameters measured up to 18 GHz and from 10 to 180 mA/mm with high gain and low power dissipation show the potential of SiGe MODFETs for mobile communications.

Original languageEnglish
Pages (from-to)1089-1090
Number of pages2
JournalElectronics Letters
Volume37
Issue number17
DOIs
StatePublished - 16 Aug 2001
Externally publishedYes

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