Visible photoluminescence from silicon nanoclusters embedded in silicon nitride films prepared by remote plasma-enhanced chemical vapor deposition

A. Benami, G. Santana, B. M. Monroy, A. Ortiz, J. C. Alonso, J. Fandiño, J. Aguilar-Hernández, G. Contreras-Puente

Producción científica: Contribución a una revistaArtículorevisión exhaustiva

8 Citas (Scopus)

Resumen

The photoluminescence (PL) of silicon nanoclusters embedded in silicon nitride films grown by remote plasma-enhanced chemical vapor deposition at 200 °C, using mixtures of SiCl4/H2/Ar/NH3 is investigated. It was found that the color and the intensity of the PL of the as-grown samples depend on the H2 flow rate, and there is an optimum flow for which a maximum luminescence is obtained. A strong improvement of the PL intensity and change in color was obtained with annealing treatments in the range of 500-1000 °C. The changes in the composition, structure and optical properties of the films, as a function of H2 flow rate and thermal treatments, were studied by means of Fourier-transform infrared spectroscopy, X-ray photoelectron spectroscopy, ellipsometry and ultraviolet-visible transmission measurements. We conclude that the PL can be attributed to quantum confinement effect in silicon nanoclusters embedded in silicon nitride matrix, which is improved when a better passivation of the nanoclusters surface is obtained.

Idioma originalInglés
Páginas (desde-hasta)148-151
Número de páginas4
PublicaciónPhysica E: Low-Dimensional Systems and Nanostructures
Volumen38
N.º1-2
DOI
EstadoPublicada - abr. 2007

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