Ingeniería y ciencia de los materiales
Atomic force microscopy
15%
Cathodoluminescence
23%
Characterization (materials science)
10%
Doping (additives)
13%
Electron energy levels
14%
Ellipsometry
20%
Energy dispersive spectroscopy
12%
Europium
22%
Fabrication
54%
Infrared radiation
10%
Ions
11%
Metals
7%
Photoluminescence
100%
Quenching
12%
Refractive index
16%
Salts
11%
Spectroscopy
13%
Spray pyrolysis
19%
Substrates
17%
Surface roughness
10%
Temperature
14%
Terbium
23%
Thin films
69%
Ultrasonics
10%
X ray diffraction
12%
Yttrium
17%
Química
Acetylacetone
16%
Application
23%
Atomic Force Microscopy
11%
Cathodoluminescence
19%
Doping Material
13%
Electroluminescence
76%
Ellipsometry
16%
Energy
6%
Energy-Dispersive Spectroscopy
15%
Ion
5%
Liquid Film
35%
Metal
6%
Optical Property
53%
Photoluminescence
56%
Polycrystalline Film
21%
Refractive Index
14%
Spray Pyrolysis
17%
Surface Roughness
14%
UV/VIS Spectroscopy
9%
X-Ray Diffraction
7%
Física y astronomía
acetylacetone
19%
atomic force microscopy
9%
cathodoluminescence
13%
characterization
6%
diffraction
6%
electronics
6%
ellipsometry
12%
energy
3%
energy levels
9%
europium
14%
fabrication
44%
ions
5%
metals
6%
photoluminescence
43%
pyrolysis
12%
quenching
10%
refractivity
8%
salts
11%
spectroscopy
12%
sprayers
11%
surface roughness
10%
synthesis
53%
temperature
10%
terbium
15%
thin films
38%
ultrasonics
9%
x rays
5%
yttrium
13%