Study on the ITO/ZnO interface and its effect on CdS/CdTe solar cell performance

M. Zapata-Torres; J. L. Fernández-Muñoz; E. Hernández-Rodríguez; R. Mis-Fernández; V. Rejon; J. L. Peña; E. Valaguez-Velazquez; A. Márquez Herrera

Study on the ITO/ZnO interface and its effect on CdS/CdTe solar cell performance

M. Zapata-Torres, J. L. Fernández-Muñoz, E. Hernández-Rodríguez, R. Mis-Fernández, V. Rejon, J. L. Peña, E. Valaguez-Velazquez, A. Márquez Herrera

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

3 Citas (Scopus)

Resumen

ZnO thin films have been deposited on ITO coated glass substrates, using RF magnetron reactive sputtering from a Zn target. The ZnO films were annealed at 560 °C for 1 hour, in order to promote the diffusion of the ITO into ZnO. The properties of the samples were analyzed by X-ray diffraction (XRD), UV-Vis spectroscopy and X-ray photoelectron spectroscopy (XPS). The ITO/ZnO interface showed a diffusion of 50 nm approximately. In order to study the effect of ZnO thickness, in the performance of the CdS/CdTe solar cell, we used an AMPS-1D solar simulator; the results showed that reduction of the ZnO thickness had a weak influence in the efficiency of the solar cell.

Idioma original	Inglés
Páginas (desde-hasta)	61-65
Número de páginas	5
Publicación	Superficies y Vacio
Volumen	28
N.º	2
Estado	Publicada - jun. 2015
Publicado de forma externa	Sí

Otros archivos y enlaces

Enlace a la publicación en Scopus

Citar esto

@article{28d7b6ba3d034c5187efe8894c5b4d9e,

title = "Study on the ITO/ZnO interface and its effect on CdS/CdTe solar cell performance",

abstract = "ZnO thin films have been deposited on ITO coated glass substrates, using RF magnetron reactive sputtering from a Zn target. The ZnO films were annealed at 560 °C for 1 hour, in order to promote the diffusion of the ITO into ZnO. The properties of the samples were analyzed by X-ray diffraction (XRD), UV-Vis spectroscopy and X-ray photoelectron spectroscopy (XPS). The ITO/ZnO interface showed a diffusion of 50 nm approximately. In order to study the effect of ZnO thickness, in the performance of the CdS/CdTe solar cell, we used an AMPS-1D solar simulator; the results showed that reduction of the ZnO thickness had a weak influence in the efficiency of the solar cell.",

keywords = "ITO, Interface, Solar cell, ZnO",

author = "M. Zapata-Torres and Fern{\'a}ndez-Mu{\~n}oz, {J. L.} and E. Hern{\'a}ndez-Rodr{\'i}guez and R. Mis-Fern{\'a}ndez and V. Rejon and Pe{\~n}a, {J. L.} and E. Valaguez-Velazquez and {M{\'a}rquez Herrera}, A.",

note = "Publisher Copyright: {\textcopyright} Sociedad Mexicana de Ciencia y Tecnolog{\'i}a de Superficies y Materiales.",

year = "2015",

month = jun,

language = "Ingl{\'e}s",

volume = "28",

pages = "61--65",

journal = "Superficies y Vacio",

issn = "1665-3521",

number = "2",

}

TY - JOUR

T1 - Study on the ITO/ZnO interface and its effect on CdS/CdTe solar cell performance

AU - Zapata-Torres, M.

AU - Fernández-Muñoz, J. L.

AU - Hernández-Rodríguez, E.

AU - Mis-Fernández, R.

AU - Rejon, V.

AU - Peña, J. L.

AU - Valaguez-Velazquez, E.

AU - Márquez Herrera, A.

N1 - Publisher Copyright: © Sociedad Mexicana de Ciencia y Tecnología de Superficies y Materiales.

PY - 2015/6

Y1 - 2015/6

N2 - ZnO thin films have been deposited on ITO coated glass substrates, using RF magnetron reactive sputtering from a Zn target. The ZnO films were annealed at 560 °C for 1 hour, in order to promote the diffusion of the ITO into ZnO. The properties of the samples were analyzed by X-ray diffraction (XRD), UV-Vis spectroscopy and X-ray photoelectron spectroscopy (XPS). The ITO/ZnO interface showed a diffusion of 50 nm approximately. In order to study the effect of ZnO thickness, in the performance of the CdS/CdTe solar cell, we used an AMPS-1D solar simulator; the results showed that reduction of the ZnO thickness had a weak influence in the efficiency of the solar cell.

AB - ZnO thin films have been deposited on ITO coated glass substrates, using RF magnetron reactive sputtering from a Zn target. The ZnO films were annealed at 560 °C for 1 hour, in order to promote the diffusion of the ITO into ZnO. The properties of the samples were analyzed by X-ray diffraction (XRD), UV-Vis spectroscopy and X-ray photoelectron spectroscopy (XPS). The ITO/ZnO interface showed a diffusion of 50 nm approximately. In order to study the effect of ZnO thickness, in the performance of the CdS/CdTe solar cell, we used an AMPS-1D solar simulator; the results showed that reduction of the ZnO thickness had a weak influence in the efficiency of the solar cell.

KW - ITO

KW - Interface

KW - Solar cell

KW - ZnO

UR - http://www.scopus.com/inward/record.url?scp=84946746344&partnerID=8YFLogxK

M3 - Artículo

SN - 1665-3521

VL - 28

SP - 61

EP - 65

JO - Superficies y Vacio

JF - Superficies y Vacio

IS - 2

ER -

Study on the ITO/ZnO interface and its effect on CdS/CdTe solar cell performance

Resumen

Otros archivos y enlaces

Huella

Citar esto