Sol-gel synthesis and structural characteristics of optical Y 3Al5O12: Eu3+Thick films

F. De; A. García Murillo; Esther Ramírez Meneses; Claudia Torres Orozco; A. De

doi:10.4028/www.scientific.net/JNanoR.9.117

Sol-gel synthesis and structural characteristics of optical Y ₃Al₅O₁₂: Eu³⁺Thick films

F. De, A. García Murillo, Esther Ramírez Meneses, Claudia Torres Orozco, A. De

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

2 Citas (Scopus)

Resumen

Thick films of Y ₃Al ₅O ₁₂: Eu ³⁺ were dip-coated on silica substrate from sols. The synthesis was accomplished by using aluminium tri-sec-butoxide, yttrium chloride and europium nitrate as starting materials and isopropanol as solvent. Single-crystalline Y ₃Al ₅O ₁₂: Eu ₃₊ cubic perovskite thick films were analyzed by X-Ray Diffraction and confirmed by Atomic Force Microscopy observations. The Y ₃Al ₅O ₁₂: Eu ₃₊ thick film waveguiding properties was studied using an He-Ne laser (632.8 nm) for "m-lines" spectroscopy (MLS), which showed that film thickness and refractive index were 1.3 μm and 1.6385 ± 0.001, respectively, after 1100 °C heat treatment. The increase is associated with film crystallization produced by different heat treatments.

Idioma original	Inglés
Páginas (desde-hasta)	117-124
Número de páginas	8
Publicación	Journal of Nano Research
Volumen	9
DOI	https://doi.org/10.4028/www.scientific.net/JNanoR.9.117
Estado	Publicada - 15 feb. 2010
Publicado de forma externa	Sí

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abstract = "Thick films of Y 3Al 5O 12: Eu 3+ were dip-coated on silica substrate from sols. The synthesis was accomplished by using aluminium tri-sec-butoxide, yttrium chloride and europium nitrate as starting materials and isopropanol as solvent. Single-crystalline Y 3Al 5O 12: Eu 3+ cubic perovskite thick films were analyzed by X-Ray Diffraction and confirmed by Atomic Force Microscopy observations. The Y 3Al 5O 12: Eu 3+ thick film waveguiding properties was studied using an He-Ne laser (632.8 nm) for {"}m-lines{"} spectroscopy (MLS), which showed that film thickness and refractive index were 1.3 μm and 1.6385 ± 0.001, respectively, after 1100 °C heat treatment. The increase is associated with film crystallization produced by different heat treatments.",

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AU - Meneses, Esther Ramírez

AU - Orozco, Claudia Torres

AU - De, A.

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