TY - JOUR
T1 - Separation of electronic and ionic conductivity in mixed conductors from the ac response
T2 - Application to Pr0.56 Bi0.04 Li0.2 Ti O3
AU - García-Sánchez, Mario Fidel
AU - Fernández, Nestor
AU - Martínez-Sarrión, María Luisa
AU - Mestres, Lourdes
AU - Fernández-Gutierrez, Floiran
AU - Santana, Guillermo
AU - Ruiz-Salvador, A. Rabdel
N1 - Funding Information:
We acknowledge the technical assistance of S. Jimenez, and partial financial support for this work from Project Nos. MAT2007-63445 and 2005SGR00184, and CONACyT-México, under Projects Nos. 48970 and 47303-F and PAPIIT-UNAM under Project No. IN-114406-2. Partial support from University of Havana is grateful acknowledged.
PY - 2008
Y1 - 2008
N2 - A method has been developed for separation of ionic and electronic conductivity in mixed conductors. The procedure is accomplished by using blocking electrodes and the Kramers-Kronig relations for separating the dc conductivity from total response. This method was applied to lithium inserted and deinserted sample of Pr0.56 Bi0.04 Li0.2 Ti O3. This material is an ionic conductor, and after insertion, electronic conduction appears in the sample. The deinserted sample has a similar electric behavior to the original material. This method does not need any previous model when processing the data. Hence, it avoids those modeling related mistakes and increases the possibilities of dielectric spectroscopy.
AB - A method has been developed for separation of ionic and electronic conductivity in mixed conductors. The procedure is accomplished by using blocking electrodes and the Kramers-Kronig relations for separating the dc conductivity from total response. This method was applied to lithium inserted and deinserted sample of Pr0.56 Bi0.04 Li0.2 Ti O3. This material is an ionic conductor, and after insertion, electronic conduction appears in the sample. The deinserted sample has a similar electric behavior to the original material. This method does not need any previous model when processing the data. Hence, it avoids those modeling related mistakes and increases the possibilities of dielectric spectroscopy.
UR - http://www.scopus.com/inward/record.url?scp=48249139902&partnerID=8YFLogxK
U2 - 10.1063/1.2959189
DO - 10.1063/1.2959189
M3 - Artículo
SN - 0003-6951
VL - 93
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 3
M1 - 034105
ER -