Sample tilting mechanism and transfer system for high-temperature thin-film deposition and ultrahigh vacuum photoelectron emission microscopy

Adrian Garcia; Martin E. Kordesch

doi:10.1116/1.578755

Sample tilting mechanism and transfer system for high-temperature thin-film deposition and ultrahigh vacuum photoelectron emission microscopy

Adrian Garcia, Martin E. Kordesch

Producción científica: Contribución a una revista › Carta › revisión exhaustiva

Idioma original	Inglés
Páginas (desde-hasta)	461-463
Número de páginas	3
Publicación	Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Volumen	11
N.º	2
DOI	https://doi.org/10.1116/1.578755
Estado	Publicada - mar. 1993
Publicado de forma externa	Sí

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title = "Sample tilting mechanism and transfer system for high-temperature thin-film deposition and ultrahigh vacuum photoelectron emission microscopy",

author = "Adrian Garcia and Kordesch, {Martin E.}",

year = "1993",

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Sample tilting mechanism and transfer system for high-temperature thin-film deposition and ultrahigh vacuum photoelectron emission microscopy. / Garcia, Adrian; Kordesch, Martin E.
En: Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films, Vol. 11, N.º 2, 03.1993, p. 461-463.

Producción científica: Contribución a una revista › Carta › revisión exhaustiva

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AU - Kordesch, Martin E.

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